Draft
International Standard
ISO/DIS 11505
Surface chemical analysis — General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
Reference number
ISO/DIS 11505
Edition 2
Draft International Standard
ISO/DIS 11505
87870
This Draft International Standard is in the enquiry phase with ISO members.
Will replace ISO 11505:2012

Abstract

ISO 11505:2013 describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films.

It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined.

General information

  •  : Under development
    : DIS registered [40.00]
  •  : 2
     : 34
  • ISO/TC 201/SC 8
    71.040.40 
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