Reference number
ISO 16700:2016
© ISO 2024
International Standard
ISO 16700:2016
Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
Edition 2
2016-08
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Published (Edition 2, 2016)
This publication was last reviewed and confirmed in 2023. Therefore this version remains current.

ISO 16700:2016

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CHF 96
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Abstract

ISO 16700:2016 specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to magnifications determined by the available size range of structures in the calibrating reference material. It does not apply to the dedicated critical dimension measurement SEM.

General information

  • Status
     : Published
    Publication date
     : 2016-08
    Stage
    : International Standard confirmed [90.93]
  • Edition
     : 2
    Number of pages
     : 18
  • Technical Committee :
    ISO/TC 202/SC 4
    ICS :
    37.020 
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