Reference number
ISO 11938:2012
International Standard
ISO 11938:2012
Microbeam analysis — Electron probe microanalysis — Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
Edition 1
2012-03
Read sample
ISO 11938:2012
51059
Published (Edition 1, 2012)
This publication was last reviewed and confirmed in 2022. Therefore this version remains current.

ISO 11938:2012

ISO 11938:2012
51059
Language
Format
CHF 63
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Abstract

This International Standard provides procedures for electron microprobe elemental-mapping analysis using

wavelength-dispersive spectrometry. The choice between mapping with the electron beam moving digitally

across the specimen (electron beam mapping) and mapping with stage movement only (large-area mapping) is

assessed. It describes five types of data processing: the raw X‑ray intensity data method, the k‑value method,

the calibration method, the correlation method and the matrix correction method.

General information

  •  : Published
     : 2012-03
    : International Standard confirmed [90.93]
  •  : 1
     : 10
  • ISO/TC 202/SC 2
    71.040.50 
  • RSS updates

Life cycle

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