Draft
International Standard
ISO/DIS 16666
Surface chemical analysis — Total reflection X-ray fluorescence — Principles and general requirements
Reference number
ISO/DIS 16666
Edition 1
Draft International Standard
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ISO/DIS 16666
84747
This Draft International Standard is in the enquiry phase with ISO members.

ISO/DIS 16666

ISO/DIS 16666
84747
Language
Format
CHF 65
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Abstract

This document specifies terms and definitions for analytical methods where elements are identified and their concentrations determined by measuring X ray fluorescence radiation. The aim of this document is to establish terms and definitions for TXRF and to match these with terms and definitions relating to X ray fluorescence analysis.

General information

  •  : Under development

    You can help develop this draft international standard by contacting your national member

    : DIS ballot initiated: 12 weeks [40.20]
  •  : 1
     : 24
  • ISO/TC 201/SC 10
    71.040.40 
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