Reference number
ISO 23833:2013
© ISO 2024
International Standard
ISO 23833:2013
Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
Edition 2
2013-04
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Published (Edition 2, 2013)

ISO 23833:2013

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CHF 42
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Abstract

ISO 23833:2013 defines terms used in the practices of electron probe microanalysis (EPMA). It covers both general and specific concepts classified according to their hierarchy in a systematic order.

ISO 23833:2013 is applicable to all standardization documents relevant to the practices of EPMA. In addition, some parts of ISO 23833:2013 are applicable to those documents relevant to the practices of related fields (SEM, AEM, EDX, etc.) for definition of those terms common to them.

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